In the upcoming NFPA 70E 2024 Edition, the inclusion of the phrase “at each point of work” and the relationship to absence of voltage testing has prompted questions regarding the use of Permanent ...

Hidden semiconductor defects often pass inspection but fail later in operation. Learn how latent defects form, evade ...

Are your environmental test results exposing true device weaknesses, or just reflecting extreme stress conditions?

Thought to be dead but is live. Known to be live, but those involved do not have adequate training/appropriate equipment or have not taken adequate precautions. Fig. 1. Forty-eight percent of reported ...

Electrical safety testing has been around for almost a century, and safety agencies have been testing and certifying products for almost as long. Electrical and electronic products have changed ...

Early results of using device-aware testing on alternative memories show expanded test coverage, but this is just the start. Once the semiconductor industry realized that it was suffering from device ...